Standard test interface language (STIL) for digital test vector data
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| Titolo: |
Standard test interface language (STIL) for digital test vector data
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| Pubblicazione: | New York : , : IEEE, , 2007 |
| Descrizione fisica: | 1 online resource (148 pages) |
| Disciplina: | 621.38150287 |
| Soggetto topico: | Integrated circuits - Testing - Standards |
| Sommario/riassunto: | Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests. |
| Titolo autorizzato: | Standard test interface language (STIL) for digital test vector data |
| ISBN: | 0-7381-5721-X |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910141756403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |