01508nam 2200349 450 991014175640332120171019095932.00-7381-5721-X(CKB)2670000000414801(WaSeSS)IndRDA00079239(NjHacI)992670000000414801(EXLCZ)99267000000041480120171019d2007 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierStandard test interface language (STIL) for digital test vector dataNew York :IEEE,2007.1 online resource (148 pages)2-8318-9337-2 Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.Integrated circuitsTestingStandardsIntegrated circuitsTestingStandards.621.38150287WaSeSSWaSeSSDOCUMENT9910141756403321Standard test interface language (STIL) for digital test vector data2580956UNINA