1.

Record Nr.

UNINA9910141756403321

Titolo

Standard test interface language (STIL) for digital test vector data

Pubbl/distr/stampa

New York : , : IEEE, , 2007

ISBN

0-7381-5721-X

Descrizione fisica

1 online resource (148 pages)

Disciplina

621.38150287

Soggetti

Integrated circuits - Testing - Standards

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.