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X-ray scattering from semiconductors [[electronic resource] /] / Paul F. Fewster



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Autore: Fewster Paul F Visualizza persona
Titolo: X-ray scattering from semiconductors [[electronic resource] /] / Paul F. Fewster Visualizza cluster
Pubblicazione: River Edge, NJ, : Imperial College Press, c2003
Edizione: 2nd ed.
Descrizione fisica: 1 online resource (310 p.)
Disciplina: 539.7222
Soggetto topico: X-rays - Scattering
Semiconductors
Soggetto genere / forma: Electronic books.
Note generali: Includes index.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Copyright; Preface; Contents; 1 - An Introduction to Semiconductor Materials; 2 - An Introduction to X-Ray Scattering; 3 - Equipment for Measuring Diffraction Patterns; 4 - A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index
Sommario/riassunto: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.
Titolo autorizzato: X-ray scattering from semiconductors  Visualizza cluster
ISBN: 1-62870-231-1
1-281-86636-9
9786611866365
1-86094-458-2
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910451134603321
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