LEADER 02471nam 2200613 a 450 001 9910451134603321 005 20200520144314.0 010 $a1-62870-231-1 010 $a1-281-86636-9 010 $a9786611866365 010 $a1-86094-458-2 035 $a(CKB)1000000000336362 035 $a(EBL)218699 035 $a(OCoLC)475925272 035 $a(SSID)ssj0000275606 035 $a(PQKBManifestationID)11233648 035 $a(PQKBTitleCode)TC0000275606 035 $a(PQKBWorkID)10219675 035 $a(PQKB)10322058 035 $a(MiAaPQ)EBC218699 035 $a(WSP)0000P289 035 $a(Au-PeEL)EBL218699 035 $a(CaPaEBR)ebr10255388 035 $a(CaONFJC)MIL186636 035 $a(EXLCZ)991000000000336362 100 $a20050222d2003 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aX-ray scattering from semiconductors$b[electronic resource] /$fPaul F. Fewster 205 $a2nd ed. 210 $aRiver Edge, NJ $cImperial College Press$dc2003 215 $a1 online resource (310 p.) 300 $aIncludes index. 311 $a1-86094-360-8 320 $aIncludes bibliographical references and index. 327 $aCopyright; Preface; Contents; 1 - An Introduction to Semiconductor Materials; 2 - An Introduction to X-Ray Scattering; 3 - Equipment for Measuring Diffraction Patterns; 4 - A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index 330 $aThis book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. 606 $aX-rays$xScattering 606 $aSemiconductors 608 $aElectronic books. 615 0$aX-rays$xScattering. 615 0$aSemiconductors. 676 $a539.7222 700 $aFewster$b Paul F$0924958 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910451134603321 996 $aX-ray scattering from semiconductors$92143983 997 $aUNINA