02471nam 2200613 a 450 991045113460332120200520144314.01-62870-231-11-281-86636-997866118663651-86094-458-2(CKB)1000000000336362(EBL)218699(OCoLC)475925272(SSID)ssj0000275606(PQKBManifestationID)11233648(PQKBTitleCode)TC0000275606(PQKBWorkID)10219675(PQKB)10322058(MiAaPQ)EBC218699(WSP)0000P289(Au-PeEL)EBL218699(CaPaEBR)ebr10255388(CaONFJC)MIL186636(EXLCZ)99100000000033636220050222d2003 uy 0engurcn|||||||||txtccrX-ray scattering from semiconductors[electronic resource] /Paul F. Fewster2nd ed.River Edge, NJ Imperial College Pressc20031 online resource (310 p.)Includes index.1-86094-360-8 Includes bibliographical references and index.Copyright; Preface; Contents; 1 - An Introduction to Semiconductor Materials; 2 - An Introduction to X-Ray Scattering; 3 - Equipment for Measuring Diffraction Patterns; 4 - A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject IndexThis book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.X-raysScatteringSemiconductorsElectronic books.X-raysScattering.Semiconductors.539.7222Fewster Paul F924958MiAaPQMiAaPQMiAaPQBOOK9910451134603321X-ray scattering from semiconductors2143983UNINA