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Titolo: |
8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
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Pubblicazione: | [Place of publication not identified], : IEEE Computer Society, 2007 |
Disciplina: | 621.39/5 |
Soggetto topico: | Integrated circuits - Reliability - Very large scale integration |
Integrated circuits - Very large scale integration - Design and construction | |
Integrated circuits - Very large scale integration - Computer-aided design | |
Integrated circuits - Testing - Quality control - Very large scale integration | |
Electrical & Computer Engineering | |
Engineering & Applied Sciences | |
Electrical Engineering | |
Note generali: | Bibliographic Level Mode of Issuance: Monograph |
Titolo autorizzato: | 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March ![]() |
ISBN: | 1-5090-8811-3 |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910142701303321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |