8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
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| Titolo: |
8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina: | 621.39/5 |
| Soggetto topico: | Integrated circuits - Reliability - Very large scale integration |
| Integrated circuits - Very large scale integration - Design and construction | |
| Integrated circuits - Very large scale integration - Computer-aided design | |
| Integrated circuits - Testing - Quality control - Very large scale integration | |
| Electrical & Computer Engineering | |
| Engineering & Applied Sciences | |
| Electrical Engineering | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| ISBN: | 1-5090-8811-3 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910142701303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |