01012nam--2200373---450-99000270347020331620080923105258.0000270347USA01000270347(ALEPH)000270347USA0100027034720060119d1964----km-y0itay0103----baitaITa|||||||001yyAi tempi dei castelli feudaliGianna Bonis CuazTorinoLoescher196474 p.ill.24 cm.<<La>> ricerca132001<<La>> ricerca132001001-------2001Feudalesimo940.1BONIS CUAZ,Gianna242270ITsalbcISBD990002703470203316FC M 1770DLMFC MBKDILAMDILAM9020060119USA011218DILAM9020080923USA011052Ai tempi dei castelli feudali650511UNISA02319oam 2200553zu 450 991014270130332120241212215415.097815090881191509088113(CKB)1000000000331006(SSID)ssj0000395948(PQKBManifestationID)12119828(PQKBTitleCode)TC0000395948(PQKBWorkID)10456817(PQKB)10546812(EXLCZ)99100000000033100620160829d2007 uy engtxtccr8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March[Place of publication not identified]IEEE Computer Society2007Bibliographic Level Mode of Issuance: Monograph9780769527956 0769527957 Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsVery large scale integrationComputer-aided designCongressesIntegrated circuitsTestingQuality controlVery large scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsVery large scale integrationComputer-aided designIntegrated circuitsTestingQuality controlVery large scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5Synopsys (Firm)IEEE Electron Devices SocietyIEEE Circuits and Systems SocietyPQKBPROCEEDING99101427013033218th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March2333388UNINA