LEADER 02264oam  2200529zu 450 
001 9910142701303321
005 20210807002718.0
010   $a1-5090-8811-3
035   $a(CKB)1000000000331006
035   $a(SSID)ssj0000395948
035   $a(PQKBManifestationID)12119828
035   $a(PQKBTitleCode)TC0000395948
035   $a(PQKBWorkID)10456817
035   $a(PQKB)10546812
035   $a(EXLCZ)991000000000331006
100   $a20160829d2007      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2007
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2795-7 
606   $aIntegrated circuits$xReliability$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xComputer-aided design$vCongresses
606   $aIntegrated circuits$xTesting$xQuality control$xVery large scale integration$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xVery large scale integration
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aIntegrated circuits$xVery large scale integration$xComputer-aided design
615  0$aIntegrated circuits$xTesting$xQuality control$xVery large scale integration
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/5
712 02$aSynopsys (Firm)
712 02$aIEEE Electron Devices Society
712 02$aIEEE Circuits and Systems Society
801  0$bPQKB
906   $aPROCEEDING
912   $a9910142701303321
996   $a8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March$92333388
997   $aUNINA