ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
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| Titolo: |
ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
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| Pubblicazione: | Piscataway, New Jersey : , : IEEE, , 1984 |
| Descrizione fisica: | 1 online resource (39 pages) |
| Disciplina: | 543.08586 |
| Soggetto topico: | X-ray spectroscopy |
| Semiconductors | |
| Sommario/riassunto: | Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered. |
| Altri titoli varianti: | ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
| Titolo autorizzato: | ANSI |
| ISBN: | 0-7381-0715-8 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910135417703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |