01614nam 2200373 450 991013541770332120231208083635.00-7381-0715-810.1109/IEEESTD.1984.81758(CKB)3780000000092180(NjHacI)993780000000092180(EXLCZ)99378000000009218020231208d1984 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierANSI/IEEE Std 759-1984 IEEE standard test procedures for semiconductor x-ray energy spectrometers /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :IEEE,1984.1 online resource (39 pages)Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy SpectrometersX-ray spectroscopySemiconductorsX-ray spectroscopy.Semiconductors.543.08586NjHacINjHaclDOCUMENT9910135417703321ANSI2072434UNINA