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200 10$aANSI/IEEE Std 759-1984 $eIEEE standard test procedures for semiconductor x-ray energy spectrometers /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, New Jersey :$cIEEE,$d1984.
215   $a1 online resource (39 pages)
330   $aTest procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
517   $aANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
606   $aX-ray spectroscopy
606   $aSemiconductors
615  0$aX-ray spectroscopy.
615  0$aSemiconductors.
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