ANSI N42.31-2003 : American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation / / IEEE

• Pubblicazione: New York : , : IEEE, , [2003]
• Descrizione fisica: 1 online resource (vii, 33 pages) : illustrations
• Disciplina: 539.2
• Soggetto topico: Ionizing radiation
• Note generali: Includes index.
• Sommario/riassunto: Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
• Altri titoli varianti: ANSI N42.31-2003: American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation
• Titolo autorizzato: ANSI N42.31-2003
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996279884703316
• Lo trovi qui: Univ. di Salerno