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101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aANSI N42.31-2003 $eAmerican National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation /$fIEEE
210  1$aNew York :$cIEEE,$d[2003]
215   $a1 online resource (vii, 33 pages) $cillustrations
300   $aIncludes index.
311   $a0-7381-3799-5 
330   $aStandard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
517   $aANSI N42.31-2003: American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation
606   $aIonizing radiation
615  0$aIonizing radiation.
676   $a539.2
712 02$aInstitute of Electrical and Electronics Engineers,
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801  1$bNjHacl
906   $aDOCUMENT
912   $a996279884703316
996   $aANSI N42.31-2003$92580858
997   $aUNISA