VLSI Test Symposium, 12th IEEE

• Pubblicazione: [Place of publication not identified], : IEEE Computer Society Press, 1994
• Descrizione fisica: 1 online resource (488 pages)
• Disciplina: 621.3815
• Soggetto topico: Integrated circuits - Very large scale integration - Testing
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Sommario/riassunto: Proceedings of the symposium held in Cherry Hill, New Jersey, April 1994. Technical sessions are devoted to synthesis and testability; testable mixed-signal circuit designs; built-in self-test; test generation and fault simulation; on-line testing; defect coverage and test quality; advanced test generation techniques; high-level mixed-signal test issues; delay fault testing; testing regular structures; design verification and manufacturing validation; IDDQ testing and bridging faults; testability concepts and applications; and fault modeling. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR.
• Titolo autorizzato: VLSI Test Symposium, 12th IEEE
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996206157103316
• Lo trovi qui: Univ. di Salerno