Proceedings of the symposium held in Cherry Hill, New Jersey, April 1994. Technical sessions are devoted to synthesis and testability; testable mixed-signal circuit designs; built-in self-test; test generation and fault simulation; on-line testing; defect coverage and test quality; advanced test generation techniques; high-level mixed-signal test issues; delay fault testing; testing regular structures; design verification and manufacturing validation; IDDQ testing and bridging faults; testability concepts and applications; and fault modeling. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR. |