Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits

• Pubblicazione: Piscataway, N.J., : IEEE Service Center
• Disciplina: 621
• Soggetto topico: Integrated circuits - Design and construction; Integrated circuits - Testing; Microelectronics - Research; Circuits intégrés - Conception et construction; Microélectronique - Recherche
• Soggetto genere / forma: Periodicals.; Conference papers and proceedings.
• ISSN: 1946-1550
• Titolo abbreviato (Periodici): Proc. Int. Symp. Phys. Fail. Analysis Integr. Circuits
• Altri titoli varianti: IPFA ... proceedings; Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits; International Symposium on the Physical and Failure Analysis of Integrated Circuits; .. IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
• Titolo autorizzato: Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Formato: Materiale a stampa
• Livello bibliografico: Periodico
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910625173203321
• Lo trovi qui: Univ. Federico II