LEADER 02997oas 2200853 a 450 001 9910625173203321 005 20251106213014.0 011 $a1946-1550 035 $a(OCoLC)297426552 035 $a(CONSER) 2009200004 035 $a(CKB)1000000000701368 035 $a(EXLCZ)991000000000701368 100 $a20090108a19889999 sy a 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aProceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits 210 $aPiscataway, N.J. $cIEEE Service Center 311 08$a1946-1542 517 1 $aIPFA ... proceedings 517 1 $aProceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits 517 1 $aInternational Symposium on the Physical and Failure Analysis of Integrated Circuits 517 1 $a... IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits 531 0 $aProc. Int. Symp. Phys. Fail. Analysis Integr. Circuits 606 $aIntegrated circuits$xDesign and construction$vCongresses 606 $aIntegrated circuits$xTesting$vCongresses 606 $aMicroelectronics$xResearch$vCongresses 606 $aCircuits inte?gre?s$xConception et construction$vCongre?s 606 $aMicroe?lectronique$xRecherche$vCongre?s 606 $aIntegrated circuits$xDesign and construction$2fast$3(OCoLC)fst00975545 606 $aIntegrated circuits$xTesting$2fast$3(OCoLC)fst00975593 606 $aMicroelectronics$xResearch$2fast$3(OCoLC)fst01019779 608 $aPeriodicals.$2fast 608 $aConference papers and proceedings.$2fast 615 0$aIntegrated circuits$xDesign and construction 615 0$aIntegrated circuits$xTesting 615 0$aMicroelectronics$xResearch 615 6$aCircuits inte?gre?s$xConception et construction 615 6$aMicroe?lectronique$xRecherche 615 7$aIntegrated circuits$xDesign and construction. 615 7$aIntegrated circuits$xTesting. 615 7$aMicroelectronics$xResearch. 676 $a621 712 02$aInstitute of Electrical and Electronics Engineers. 712 02$aIEEE Singapore Section. 712 02$aIEEE Electron Devices Society. 801 0$bNSD 801 1$bNSD 801 2$bNSD 801 2$bOCLCQ 801 2$bOCLCF 801 2$bOCLCO 801 2$bOCL 801 2$bOCLCA 801 2$bOCLCQ 801 2$bOCLCA 801 2$bAU@ 801 2$bOCL 801 2$bDLC 801 2$bOCLCQ 801 2$bU3W 801 2$bOCLCQ 801 2$bUAB 801 2$bOCLCL 801 2$bSRU 801 2$bSFB 801 2$bOCLCL 801 2$bOCLCQ 906 $aCONFERENCE 912 $a9910625173203321 996 $aProceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits$91886730 997 $aUNINA