02997oas 2200853 a 450 991062517320332120251106213014.01946-1550(OCoLC)297426552(CONSER) 2009200004(CKB)1000000000701368(EXLCZ)99100000000070136820090108a19889999 sy aengur|||||||||||txtrdacontentcrdamediacrrdacarrierProceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated CircuitsPiscataway, N.J. IEEE Service Center1946-1542 IPFA ... proceedingsProceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated CircuitsInternational Symposium on the Physical and Failure Analysis of Integrated Circuits... IEEE ... International Symposium on the Physical and Failure Analysis of Integrated CircuitsProc. Int. Symp. Phys. Fail. Analysis Integr. CircuitsIntegrated circuitsDesign and constructionCongressesIntegrated circuitsTestingCongressesMicroelectronicsResearchCongressesCircuits intégrésConception et constructionCongrèsMicroélectroniqueRechercheCongrèsIntegrated circuitsDesign and constructionfast(OCoLC)fst00975545Integrated circuitsTestingfast(OCoLC)fst00975593MicroelectronicsResearchfast(OCoLC)fst01019779Periodicals.fastConference papers and proceedings.fastIntegrated circuitsDesign and constructionIntegrated circuitsTestingMicroelectronicsResearchCircuits intégrésConception et constructionMicroélectroniqueRechercheIntegrated circuitsDesign and construction.Integrated circuitsTesting.MicroelectronicsResearch.621Institute of Electrical and Electronics Engineers.IEEE Singapore Section.IEEE Electron Devices Society.NSDNSDNSDOCLCQOCLCFOCLCOOCLOCLCAOCLCQOCLCAAU@OCLDLCOCLCQU3WOCLCQUABOCLCLSRUSFBOCLCLOCLCQCONFERENCE9910625173203321Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits1886730UNINA