2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits : 16-19 July 2018, Singapore / / Institute of Electrical and Electronics Engineers
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| Titolo: |
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits : 16-19 July 2018, Singapore / / Institute of Electrical and Electronics Engineers
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica: | 1 online resource (146 pages) |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Reliability |
| Integrated circuits - Testing | |
| Semiconductors - Failures | |
| Titolo autorizzato: | 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| ISBN: | 1-5386-4929-2 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910284450903321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |