2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits : 16-19 July 2018, Singapore / / Institute of Electrical and Electronics Engineers

• Record Nr.: UNINA9910284450903321
• Pubbl/distr/stampa: Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
• ISBN: 1-5386-4929-2
• Descrizione fisica: 1 online resource (146 pages)
• Disciplina: 621.3815
• Soggetti: Integrated circuits - Reliability; Integrated circuits - Testing; Semiconductors - Failures
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia