01440nam 2200385 450 991028445090332120230814224256.01-5386-4929-2(CKB)4100000006459870(WaSeSS)IndRDA00122316(EXLCZ)99410000000645987020200424d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits 16-19 July 2018, Singapore /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (146 pages)1-5386-4930-6 Integrated circuitsReliabilityCongressesIntegrated circuitsTestingCongressesSemiconductorsFailuresCongressesIntegrated circuitsReliabilityIntegrated circuitsTestingSemiconductorsFailures621.3815Institute of Electrical and Electronics Engineers,WaSeSSWaSeSSPROCEEDING99102844509033212018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits2539392UNINA