1996 IEEE International Conference on Microelectronic Test Structures

• Pubblicazione: [Place of publication not identified], : IEEE, 1996
• Descrizione fisica: 1 online resource (338 pages)
• Disciplina: 621.3815
• Soggetto topico: Integrated circuits; Microelectronics
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Sommario/riassunto: The papers included in this leading international conference examine test structures for microelectronic devices, their recent progress and future directions. Included is a detailed treatment of current developments in silicon and gallium arsenide microelectronic test structure research, implementation, and applications. Also addressed are advances in device characterization, such as increased miniaturization, reduced operating voltages and reduced power requirements through improved measurement and test techniques. Topics highlighted include: Process Characterization, Dimensional Measurements, Interconnection, SOI & Material Characterization, Reliability, Device Characterization, Capacitance Measurements, Statistics.
• Titolo autorizzato: 1996 IEEE International Conference on Microelectronic Test Structures
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996204464603316
• Lo trovi qui: Univ. di Salerno