1998 International Conference on Indium Phosphide and Related Materials

• Pubblicazione: [Place of publication not identified], : IEEE, 1998
• Descrizione fisica: 1 online resource (800 pages)
• Disciplina: 621.38152
• Soggetto topico: Indium phosphide
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Sommario/riassunto: The papers included in this leading international conference examine test structures for microelectronic devices, their recent progress and future directions. Included is a detailed treatment of current developments in microelectronic test structure research, implementation, and applications. Also addressed are advances in device characterization, such as increased miniaturization, reduced operating voltages and reduced power requirements through improved measurement and test techniques. Topics highlighted include: Process Characterization, Dimensional Measurements, Interconnection, Material Characterization, Reliability, Device Characterization, and Statistics.
• Titolo autorizzato: 1998 International Conference on Indium Phosphide and Related Materials
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910872857603321
• Lo trovi qui: Univ. Federico II