A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / / Frank L. McCrackin
(Visualizza in formato marc)
(Visualizza in BIBFRAME)
| Autore: |
McCrackin F. L (Frank L.)
|
| Titolo: |
A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films / / Frank L. McCrackin
|
| Pubblicazione: | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1964 |
| Descrizione fisica: | 1 online resource |
| Soggetto topico: | FORTRAN (Computer program language) |
| Thin films - Optical properties | |
| Altri autori: | McCrackinF. L (Frank L.) |
| Note generali: | 1964. |
| Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. | |
| Title from PDF title page. | |
| Nota di bibliografia: | Includes bibliographical references. |
| Titolo autorizzato: | A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910711247303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |