01632aam 2200421I 450 991071124730332120151113033654.0GOVPUB-C13-36ea74baef3e4fdcd29f930f0c757719(CKB)5470000002481549(OCoLC)929059772(EXLCZ)99547000000248154920151113d1964 ua 0engrdacontentrdamediardacarrierA Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /Frank L. McCrackinGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1964.1 online resourceNBS technical note ;2421964.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.FORTRAN (Computer program language)Thin filmsOptical propertiesFORTRAN (Computer program language)Thin filmsOptical properties.McCrackin F. L(Frank L.)1386933McCrackin F. L(Frank L.)1386933United States.National Bureau of Standards.NBSNBSGPOBOOK9910711247303321A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films3535781UNINA