LEADER 01632aam  2200421I  450 
001 9910711247303321
005 20151113033654.0
024 8 $aGOVPUB-C13-36ea74baef3e4fdcd29f930f0c757719
035   $a(CKB)5470000002481549
035   $a(OCoLC)929059772
035   $a(EXLCZ)995470000002481549
100   $a20151113d1964      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 12$aA Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /$fFrank L. McCrackin
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1964.
215   $a1 online resource
225 1 $aNBS technical note ;$v242
300   $a1964.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
606   $aFORTRAN (Computer program language)
606   $aThin films$xOptical properties
615  0$aFORTRAN (Computer program language)
615  0$aThin films$xOptical properties.
700   $aMcCrackin$b F. L$g(Frank L.)$01386933
701   $aMcCrackin$b F. L$g(Frank L.)$01386933
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711247303321
996   $aA Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films$93535781
997   $aUNINA