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Recent Advances in Metrology : Select Proceedings of AdMet 2021 / / edited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg



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Titolo: Recent Advances in Metrology : Select Proceedings of AdMet 2021 / / edited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg Visualizza cluster
Pubblicazione: Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023
Edizione: 1st ed. 2023.
Descrizione fisica: 1 online resource (376 pages)
Disciplina: 681.2
Soggetto topico: Electronics
Quantum physics
Atoms
Metrology
Electronics and Microelectronics, Instrumentation
Quantum Measurement and Metrology
Metrology and Fundamental Constants
Persona (resp. second.): YadavSanjay
Nota di bibliografia: Includes bibliographical references.
Nota di contenuto: Energy Harvesting and Health Tracking using Smart-Shoe -- Uncertainty Evaluation through Monte Carlo Simulation for Flatness Measurement of Optical Flats -- Internet of Things and Cognitive Radio Networks Applications, Challenges and Future -- Carbon Nanotubes based Biosensors -- Design and Analysis of Lever Type Chainless Drive Mechanism of a Bicycle.
Sommario/riassunto: This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement. .
Titolo autorizzato: Recent advances in metrology  Visualizza cluster
ISBN: 981-19-2468-6
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910627257903321
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Serie: Lecture Notes in Electrical Engineering, . 1876-1119 ; ; 906