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010   $a981-19-2468-6
024 7 $a10.1007/978-981-19-2468-2
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035   $a(Au-PeEL)EBL7052874
035   $a(CKB)24286016100041
035   $a(DE-He213)978-981-19-2468-2
035   $a(PPN)263897885
035   $a(EXLCZ)9924286016100041
100   $a20220727d2023      u|         0
101 0 $aeng
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181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aRecent Advances in Metrology $eSelect Proceedings of AdMet 2021 /$fedited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg
205   $a1st ed. 2023.
210  1$aSingapore :$cSpringer Nature Singapore :$cImprint: Springer,$d2023.
215   $a1 online resource (376 pages)
225 1 $aLecture Notes in Electrical Engineering,$x1876-1119 ;$v906
311 08$aPrint version: Yadav, Sanjay Recent Advances in Metrology Singapore : Springer,c2022 9789811924675 
320   $aIncludes bibliographical references.
327   $aEnergy Harvesting and Health Tracking using Smart-Shoe -- Uncertainty Evaluation through Monte Carlo Simulation for Flatness Measurement of Optical Flats -- Internet of Things and Cognitive Radio Networks Applications, Challenges and Future -- Carbon Nanotubes based Biosensors -- Design and Analysis of Lever Type Chainless Drive Mechanism of a Bicycle.
330   $aThis book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement. .
410  0$aLecture Notes in Electrical Engineering,$x1876-1119 ;$v906
606   $aElectronics
606   $aQuantum physics
606   $aAtoms
606   $aMetrology
606   $aElectronics and Microelectronics, Instrumentation
606   $aQuantum Measurement and Metrology
606   $aMetrology and Fundamental Constants
615  0$aElectronics.
615  0$aQuantum physics.
615  0$aAtoms.
615  0$aMetrology.
615 14$aElectronics and Microelectronics, Instrumentation.
615 24$aQuantum Measurement and Metrology.
615 24$aMetrology and Fundamental Constants.
676   $a681.2
702   $aYadav$b Sanjay
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910627257903321
996   $aRecent advances in metrology$92999272
997   $aUNINA