03335nam 22006135 450 991062725790332120230728140330.0981-19-2468-610.1007/978-981-19-2468-2(MiAaPQ)EBC7052874(Au-PeEL)EBL7052874(CKB)24286016100041(DE-He213)978-981-19-2468-2(PPN)263897885(EXLCZ)992428601610004120220727d2023 u| 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierRecent Advances in Metrology Select Proceedings of AdMet 2021 /edited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg1st ed. 2023.Singapore :Springer Nature Singapore :Imprint: Springer,2023.1 online resource (376 pages)Lecture Notes in Electrical Engineering,1876-1119 ;906Print version: Yadav, Sanjay Recent Advances in Metrology Singapore : Springer,c2022 9789811924675 Includes bibliographical references.Energy Harvesting and Health Tracking using Smart-Shoe -- Uncertainty Evaluation through Monte Carlo Simulation for Flatness Measurement of Optical Flats -- Internet of Things and Cognitive Radio Networks Applications, Challenges and Future -- Carbon Nanotubes based Biosensors -- Design and Analysis of Lever Type Chainless Drive Mechanism of a Bicycle.This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement. .Lecture Notes in Electrical Engineering,1876-1119 ;906ElectronicsQuantum physicsAtomsMetrologyElectronics and Microelectronics, InstrumentationQuantum Measurement and MetrologyMetrology and Fundamental ConstantsElectronics.Quantum physics.Atoms.Metrology.Electronics and Microelectronics, Instrumentation.Quantum Measurement and Metrology.Metrology and Fundamental Constants.681.2Yadav SanjayMiAaPQMiAaPQMiAaPQBOOK9910627257903321Recent advances in metrology2999272UNINA