2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff
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| Titolo: |
2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff
|
| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
| Descrizione fisica: | 1 online resource (485 pages) : illustrations |
| Disciplina: | 621.38411 |
| Soggetto topico: | Radio frequency |
| Semiconductors - Testing | |
| Computer software - Testing | |
| Sommario/riassunto: | International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers. |
| Altri titoli varianti: | 2017 IEEE International Test Conference |
| Titolo autorizzato: | 2017 IEEE International Test Conference (ITC) |
| ISBN: | 1-5386-3413-9 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910250058603321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |