01812nam 2200397 450 991025005860332120230419093641.01-5386-3413-9(CKB)4100000001383850(NjHacI)994100000001383850(EXLCZ)99410000000138385020230419d2017 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2017 IEEE International Test Conference (ITC) /Institute of Electrical and Electronics Engineers StaffPiscataway, New Jersey :Institute of Electrical and Electronics Engineers (IEEE),2017.1 online resource (485 pages) illustrations1-5386-3414-7 International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.2017 IEEE International Test Conference Radio frequencyCongressesSemiconductorsTestingComputer softwareTestingCongressesRadio frequencySemiconductorsTesting.Computer softwareTesting621.38411NjHacINjHaclPROCEEDING99102500586033212017 IEEE International Test Conference (ITC)2540691UNINA