1.

Record Nr.

UNINA9910250058603321

Titolo

2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff

Pubbl/distr/stampa

Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017

ISBN

1-5386-3413-9

Descrizione fisica

1 online resource (485 pages) : illustrations

Disciplina

621.38411

Soggetti

Radio frequency

Semiconductors - Testing

Computer software - Testing

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.