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Electronic Materials Innovations and Reliability in Advanced Memory Packaging / / by Chong Leong Gan, Chen Yu Huang



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Autore: Gan Chong Leong Visualizza persona
Titolo: Electronic Materials Innovations and Reliability in Advanced Memory Packaging / / by Chong Leong Gan, Chen Yu Huang Visualizza cluster
Pubblicazione: Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025
Edizione: 1st ed. 2025.
Descrizione fisica: 1 online resource (278 pages)
Disciplina: 541.0421
621.3815
Soggetto topico: Electronics - Materials
Electronic circuits
Electronic circuit design
Materials
Industrial engineering
Production engineering
Electronic Materials
Electronic Circuits and Systems
Electronics Design and Verification
Materials Engineering
Industrial and Production Engineering
Altri autori: HuangChen-Yu  
Nota di contenuto: Influences of Electronic Materials Properties on Packaging Reliability -- Mechanical and Thermal Stress of Encapsulant and New Materials in Memory Packaging -- Materials Development for Future Data Center Applications -- Advanced Chiplets and Heterogenous Integration in Memory Device Packaging -- Hybrid Bonding Device Packaging -- Hardware Reliability for Memory Modules and SSDs -- Innovative Sustainable Electronics Materials in Advanced Memory Packaging -- PCB and Substrate in Future Memory Applications.
Sommario/riassunto: This book provides a comprehensive introduction the reliability, and electronic materials innovations in advanced memory device packaging from component to system level. Special features of this book are sections covering not only the advanced packaging materials, but also system level packaging and integration in memory modules and solid state drives (SSD). The book is an extremely useful and applicable guide to professionals and students on materials reliability in memory device packaging - from component to system level.
Titolo autorizzato: Electronic Materials Innovations and Reliability in Advanced Memory Packaging  Visualizza cluster
ISBN: 3-031-94795-9
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9911015970103321
Lo trovi qui: Univ. Federico II
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Serie: Springer Series in Reliability Engineering, . 2196-999X