Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy
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| Autore: |
Joy David C. <1943->
|
| Titolo: |
Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy
|
| Pubblicazione: | New York, : Oxford University Press, 1995 |
| Edizione: | 1st ed. |
| Descrizione fisica: | 1 online resource (225 p.) |
| Disciplina: | 502/.8/25 |
| Soggetto topico: | Electron microscopy - Computer simulation |
| Electron probe microanalysis - Computer simulation | |
| Monte Carlo method | |
| Note generali: | Previously issued in print: 1995. |
| Nota di bibliografia: | Includes bibliographical references. |
| Nota di contenuto: | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Sommario/riassunto: | 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? |
| Titolo autorizzato: | Monte Carlo modeling for electron microscopy and microanalysis |
| ISBN: | 0-19-773242-9 |
| 1-280-53489-3 | |
| 9786610534890 | |
| 0-19-535846-5 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910808190203321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Oxford series in optical and imaging sciences ; ; 9.