Vai al contenuto principale della pagina
Autore: |
Hammoud Ahmad N.
![]() |
Titolo: |
Low temperature characterization of ceramic and film power capacitors / / Ahmad Hammoud and Eric Overton
![]() |
Pubblicazione: | Cleveland, Ohio : , : National Aeronautics and Space Administration, Lewis Research Center, , September 1996 |
Descrizione fisica: | 1 online resource (4 pages) : illustrations |
Soggetto topico: | Electric equipment |
Capacitors | |
Cryogenics | |
Dielectric properties | |
Exposure | |
Low temperature | |
Persona (resp. second.): | OvertonEric |
Note generali: | Title from title screen (viewed July 20, 2016). |
"September 1996"--Report documentation page. | |
"Prepared for the 1996 Conference on Electrical Insulation and Dielectric Phenomena sponsored by the IEEE Dielectrics and Electrical Insulation Society, Millbrae, California, October 20-23, 1996." | |
"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page. | |
Nota di bibliografia: | Includes bibliographical references (page 3). |
Titolo autorizzato: | Low temperature characterization of ceramic and film power capacitors ![]() |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910707349303321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |