Low temperature characterization of ceramic and film power capacitors / / Ahmad Hammoud and Eric Overton
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| Autore: |
Hammoud Ahmad N.
|
| Titolo: |
Low temperature characterization of ceramic and film power capacitors / / Ahmad Hammoud and Eric Overton
|
| Pubblicazione: | Cleveland, Ohio : , : National Aeronautics and Space Administration, Lewis Research Center, , September 1996 |
| Descrizione fisica: | 1 online resource (4 pages) : illustrations |
| Soggetto topico: | Electric equipment |
| Capacitors | |
| Cryogenics | |
| Dielectric properties | |
| Exposure | |
| Low temperature | |
| Persona (resp. second.): | OvertonEric |
| Note generali: | Title from title screen (viewed July 20, 2016). |
| "September 1996"--Report documentation page. | |
| "Prepared for the 1996 Conference on Electrical Insulation and Dielectric Phenomena sponsored by the IEEE Dielectrics and Electrical Insulation Society, Millbrae, California, October 20-23, 1996." | |
| "Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page. | |
| Nota di bibliografia: | Includes bibliographical references (page 3). |
| Titolo autorizzato: | Low temperature characterization of ceramic and film power capacitors |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910707349303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |