02104nam 2200529I 450 991070734930332120160720133555.0(CKB)5470000002464025(OCoLC)953800241(EXLCZ)99547000000246402520160720j199609 ua 0engurbn|||||||||txtrdacontentcrdamediacrrdacarrierLow temperature characterization of ceramic and film power capacitors /Ahmad Hammoud and Eric OvertonCleveland, Ohio :National Aeronautics and Space Administration, Lewis Research Center,September 1996.1 online resource (4 pages) illustrationsNASA technical memorandum ;107308Title from title screen (viewed July 20, 2016)."September 1996"--Report documentation page."Prepared for the 1996 Conference on Electrical Insulation and Dielectric Phenomena sponsored by the IEEE Dielectrics and Electrical Insulation Society, Millbrae, California, October 20-23, 1996.""Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.Includes bibliographical references (page 3).Electric equipmentnasatCapacitorsnasatCryogenicsnasatDielectric propertiesnasatExposurenasatLow temperaturenasatElectric equipment.Capacitors.Cryogenics.Dielectric properties.Exposure.Low temperature.Hammoud Ahmad N.1404498Overton EricLewis Research Center,United States.National Aeronautics and Space Administration,GPOGPOBOOK9910707349303321Low temperature characterization of ceramic and film power capacitors3479223UNINA