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035   $a(EXLCZ)995470000002464025
100   $a20160720j199609    ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aLow temperature characterization of ceramic and film power capacitors /$fAhmad Hammoud and Eric Overton
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Lewis Research Center,$dSeptember 1996.
215   $a1 online resource (4 pages) $cillustrations
225 1 $aNASA technical memorandum ;$v107308
300   $aTitle from title screen (viewed July 20, 2016).
300   $a"September 1996"--Report documentation page.
300   $a"Prepared for the 1996 Conference on Electrical Insulation and Dielectric Phenomena sponsored by the IEEE Dielectrics and Electrical Insulation Society, Millbrae, California, October 20-23, 1996."
300   $a"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.
320   $aIncludes bibliographical references (page 3).
606   $aElectric equipment$2nasat
606   $aCapacitors$2nasat
606   $aCryogenics$2nasat
606   $aDielectric properties$2nasat
606   $aExposure$2nasat
606   $aLow temperature$2nasat
615  7$aElectric equipment.
615  7$aCapacitors.
615  7$aCryogenics.
615  7$aDielectric properties.
615  7$aExposure.
615  7$aLow temperature.
700   $aHammoud$b Ahmad N.$01404498
702   $aOverton$b Eric
712 02$aLewis Research Center,
712 02$aUnited States.$bNational Aeronautics and Space Administration,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910707349303321
996   $aLow temperature characterization of ceramic and film power capacitors$93479223
997   $aUNINA