C62.59-2019 : IEEE standard for test methods and preferred values for silicon PN-junction clamping diodes / / Institute of Electrical and Electronics Engineers
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| Titolo: |
C62.59-2019 : IEEE standard for test methods and preferred values for silicon PN-junction clamping diodes / / Institute of Electrical and Electronics Engineers
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| Pubblicazione: | New York, New York : , : IEEE, , 2019 |
| Descrizione fisica: | 1 online resource (41 pages) |
| Disciplina: | 621.3815 |
| Soggetto topico: | Diodes, Semiconductor |
| Sommario/riassunto: | Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators. |
| Titolo autorizzato: | C62.59-2019 |
| ISBN: | 1-5044-6119-3 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910347938703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |