Advanced Optical Spectroscopy Techniques for Semiconductors : Raman, Infrared, and Cathodoluminescence Spectroscopy / Masanobu Yoshikawa

• Autore: Yoshikawa, Masanobu
• Pubblicazione: Cham, : Springer, 2023
• Descrizione fisica: xi, 223 p. : ill. ; 24 cm
• Soggetto topico: 78-XX - Optics, electromagnetic theory [MSC 2020]; 82-XX - Statistical mechanics, structure of matter [MSC 2020]
• Soggetto non controllato: Characterization of Semiconductors; Crystal Orientation Characterization; Gallium Arsenide Devices; Indium Phosphate Devices; Michelson Interferometer; Nano-Diamond Thin Films; Scanning Electron Transmission Microscopy; Scanning Near-field Optical Microscopy; Spectroscopy of Semiconductors; Strained Silicon; Stress Determination Using Raman Spectroscopy; Terahertz Time-Domain Spectroscopy; Vibrational spectroscopy
• Titolo autorizzato: Advanced Optical Spectroscopy Techniques for Semiconductors
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: VAN00284797
• Lo trovi qui: Univ. Vanvitelli
• Localizzazioni e accesso elettronico: https://doi.org/10.1007/978-3-031-19722-2