02137nam0 22004933i 450 VAN0028479720250320102752.719N978303119722220250116d2023 |0itac50 baengCH|||| |||||i e bcrAdvanced Optical Spectroscopy Techniques for SemiconductorsRaman, Infrared, and Cathodoluminescence SpectroscopyMasanobu YoshikawaChamSpringer2023xi, 223 p.ill.24 cm78-XXOptics, electromagnetic theory [MSC 2020]VANC022356MF82-XXStatistical mechanics, structure of matter [MSC 2020]VANC021931MFCharacterization of SemiconductorsKW:KCrystal Orientation CharacterizationKW:KGallium Arsenide DevicesKW:KIndium Phosphate DevicesKW:KMichelson InterferometerKW:KNano-Diamond Thin FilmsKW:KScanning Electron Transmission MicroscopyKW:KScanning Near-field Optical MicroscopyKW:KSpectroscopy of SemiconductorsKW:KStrained SiliconKW:KStress Determination Using Raman SpectroscopyKW:KTerahertz Time-Domain SpectroscopyKW:KVibrational spectroscopyKW:KCHChamVANL001889YoshikawaMasanobuVANV2386811349102Springer <editore>VANV108073650ITSOL20250321RICAhttps://doi.org/10.1007/978-3-031-19722-2E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN00284797BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08DLOAD e-Book 10258 08eMF10258 20250124 Advanced Optical Spectroscopy Techniques for Semiconductors3087040UNICAMPANIA