LEADER 02137nam0 22004933i 450 001 VAN00284797 005 20250320102752.719 017 70$2N$a9783031197222 100 $a20250116d2023 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 181 $ai$b e 182 $ab 183 $acr 200 1 $aAdvanced Optical Spectroscopy Techniques for Semiconductors$eRaman, Infrared, and Cathodoluminescence Spectroscopy$fMasanobu Yoshikawa 210 $aCham$cSpringer$d2023 215 $axi, 223 p.$cill.$d24 cm 606 $a78-XX$xOptics, electromagnetic theory [MSC 2020]$3VANC022356$2MF 606 $a82-XX$xStatistical mechanics, structure of matter [MSC 2020]$3VANC021931$2MF 610 $aCharacterization of Semiconductors$9KW:K 610 $aCrystal Orientation Characterization$9KW:K 610 $aGallium Arsenide Devices$9KW:K 610 $aIndium Phosphate Devices$9KW:K 610 $aMichelson Interferometer$9KW:K 610 $aNano-Diamond Thin Films$9KW:K 610 $aScanning Electron Transmission Microscopy$9KW:K 610 $aScanning Near-field Optical Microscopy$9KW:K 610 $aSpectroscopy of Semiconductors$9KW:K 610 $aStrained Silicon$9KW:K 610 $aStress Determination Using Raman Spectroscopy$9KW:K 610 $aTerahertz Time-Domain Spectroscopy$9KW:K 610 $aVibrational spectroscopy$9KW:K 620 $aCH$dCham$3VANL001889 700 1$aYoshikawa$bMasanobu$3VANV238681$01349102 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20250321$gRICA 856 4 $uhttps://doi.org/10.1007/978-3-031-19722-2$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN00284797 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08DLOAD e-Book 10258 $e08eMF10258 20250124 996 $aAdvanced Optical Spectroscopy Techniques for Semiconductors$93087040 997 $aUNICAMPANIA