The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
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| Titolo: |
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society Press, 1990 |
| Disciplina: | 621.381/5 |
| Soggetto topico: | Integrated circuits - Testing |
| Electronic digital computers - Testing - Circuits | |
| Automatic test equipment - Testing | |
| Semiconductors | |
| Electrical & Computer Engineering | |
| Engineering & Applied Sciences | |
| Electrical Engineering | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996211380203316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |