00764nam0-22002891i-450-9900039192604033213-437-50275-1000391926FED01000391926(Aleph)000391926FED0100039192620020717d1983----km-y0itay50------baTedDHOrdoWalter Eucken und Franz Bohm1983New York and StuttgartGustav Fischer Verlag1983260 p22 cmEucken,Walter<1891-1950>122870Bohm,Franz147647ITUNINARICAUNIMARCBK990003919260403321A02.1188555DECTSDECTSOrdo515775UNINA02030oam 2200517zu 450 99621138020331620210807003606.0(CKB)111026746748708(SSID)ssj0000443316(PQKBManifestationID)12191128(PQKBTitleCode)TC0000443316(PQKBWorkID)10455911(PQKB)11301841(EXLCZ)9911102674674870820160829d1990 uy engtxtccrThe changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC[Place of publication not identified]IEEE Computer Society Press1990Bibliographic Level Mode of Issuance: Monograph0-8186-9064-X Integrated circuitsTestingCongressesElectronic digital computersTestingCircuitsCongressesAutomatic test equipmentTestingCongressesSemiconductorsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingElectronic digital computersTestingCircuitsAutomatic test equipmentTestingSemiconductorsElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.381/5IEEE Computer Society Philadelphia Chapter.IEEE Computer Society Test Technology Technical CommitteeInternational Test ConferencePQKBBOOK996211380203316The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC2546571UNISA