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100   $a20160829d1990      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 14$aThe changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1990
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-9064-X 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic digital computers$xTesting$xCircuits$vCongresses
606   $aAutomatic test equipment$xTesting$vCongresses
606   $aSemiconductors$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aElectronic digital computers$xTesting$xCircuits
615  0$aAutomatic test equipment$xTesting
615  0$aSemiconductors
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.381/5
712 02$aIEEE Computer Society Philadelphia Chapter.
712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aInternational Test Conference
801  0$bPQKB
906   $aBOOK
912   $a996211380203316
996   $aThe changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC$92546571
997   $aUNISA