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Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California



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Titolo: Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California Visualizza cluster
Pubblicazione: [Place of publication not identified], : IEEE Computer Society, 2000
Disciplina: 621.39/732
Soggetto topico: Semiconductor storage devices - Testing
Random access memory
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
Persona (resp. second.): RajsumanRochit
WikT
Note generali: Bibliographic Level Mode of Issuance: Monograph
Titolo autorizzato: Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California  Visualizza cluster
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910872422603321
Lo trovi qui: Univ. Federico II
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