01936oam 2200517zu 450 991087242260332120241212214759.0(CKB)111026746701432(SSID)ssj0000395442(PQKBManifestationID)12118419(PQKBTitleCode)TC0000395442(PQKBWorkID)10450597(PQKB)11460745(EXLCZ)9911102674670143220160829d2000 uy engtxtccrRecords of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California[Place of publication not identified]IEEE Computer Society2000Bibliographic Level Mode of Issuance: Monograph9780769506890 0769506895 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Rajsuman RochitWik TIEEE Computer Society Technical Committee on VLSI,IEEE Computer Society Technical Council on Test Technology.IEEE Computer SocietyIEEE International Workshop on Memory Technology, Design, and Testing.PQKBPROCEEDING9910872422603321Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California2353609UNINA