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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007



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Titolo: Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007 Visualizza cluster
Pubblicazione: De Gruyter, 2008
Berlin ; ; Boston : , : Oldenbourg Wissenschaftsverlag, , [2015]
©2008
Descrizione fisica: 1 online resource (xii, 305 pages) : illustrations
Soggetto topico: Cosmic physics
Geophysics
Persona (resp. second.): BaczmańskiA
FaisA
MahajanA
TiduA
LarsonB. C.
Red'kinB. N.
HelmC. A.
GenzelCh
WüstefeldCh
HeD.
HegerD
KaurD
PathakD
RafajaD
Deepak
KudrenkoE. A.
PonyatovskyE. G.
MittemeijerE. J.
BorcaE
CotoiE
FilatovE
KrokeE
StrukovaG. K.
SchreiberG
CurtiusH
HolzschuhH
PesentiH
WulffH
ShmytkoI. M.
Shmyt'koI. M.
TomovI
ZizakI
RobinsonIan K.
FrancisJ. A.
WangJ. Y.
TischlerJ. Z.
BergmannJ
DrahokoupilJ
MusilJ
ČížekJ
ŠíchaJ
SaanouniK
UferK
WierzbanowskiK
LevineL. E.
NichtováL
KassnerM. E.
StoudtM. R.
BercuM
BirkholzM
DopitaM
FrançoisM
GriffithsM
JanečekM
KlausM
LeoniM
MotylenkoM
QuaasM
RůžičkaM
SchwarzM
SharafutdinovM
StranyánekM
TurskiM
WohlschlögelM
ČerčanskýM
ČerňanskýM
Mittemeijer
KlassenN. V.
DarowskiN
GanevN
HfaiedhN
KaurN
IvanovaO
ThomasO
WithersP. J.
BoháčP
GeantilP
LipinskiP
ScardiP
BediR. K.
DohrmannR
KleebergR
KuželR
ČtvrtlíkR
BrarS. S.
CherepanovaS. V.
TsybulyaS. V.
GeorgescuS.
HodorogeaS.
KumarS.
VassilevS.
BarsukovaT
WelzelU
ZlokazovV. B.
KedrovV. V.
SinitsynV. V.
CherkaskaV
KlemmV
LiuW
KuruY
ShubinYu
MatějZ
Note generali: Bibliographic Level Mode of Issuance: Monograph
Nota di bibliografia: Includes bibliographical references.
Nota di contenuto: Frontmatter -- PREFACE -- Table of Contents -- PLANAR FAULTING -- Diffraction analysis of layer disorder / Leoni, M. -- Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering / Cherepanova, S. V. / Tsybulya, S. V. -- NANOCRYSTALLINE MATERIALS -- Interference phenomena in nanocrystalline materials and their application in the microstructure analysis / Rafaja, D. / Klemm, V. / Wüstefeld, Ch. / Motylenko, M. / Dopita, M. / Schwarz, M. / Barsukova, T. / Kroke, E. -- Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources / Robinson, Ian K. -- Capacitor discharge sintering of nanocrystalline copper / Fais, A. / Scardi, P. -- Microstructure study on BN nanocomposites using XRD and HRTEM / Motylenko, M. / Klemm, V. / Schreiber, G. / Rafaja, D. / Schwarz, M. / Barsukova, T. / Kroke, E. -- PLASTIC DEFORMATION -- Impact of dislocation cell elastic strain variations on line profiles from deformed copper / Levine, L. E. / Larson, B. C. / Tischler, J. Z. / Geantil, P. / Kassner, M. E. / Liu, W. / Stoudt, M. R. -- Determination of stored elastic energy in plastically deformed copper / Baczmański, A. / Hfaiedh, N. / François, M. / Saanouni, K. / Wierzbanowski, K. -- Structural studies of submicrocrystalline copper and copper composites by different methods / Kužel, R. / Cherkaska, V. / Matěj, Z. / Janeček, M. / Čížek, J. / Dopita, M. -- Grain stresses and elastic energy in ferritic steel under uniaxial load / Baczmański, A. / Tidu, A. / Lipinski, P. / Wierzbanowski, K. -- Stress and hardness in surface layers of shot-peened steels / Drahokoupil, J. / Ganev, N. / Čerňanský, M. / Boháč, P. / Čtvrtlík, R. / Stranyánek, M. -- LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN -- The "state of the art" of the diffraction analysis of crystallite size and lattice strain / Mittemeijer, E. J. / Welzel, U. -- Recent advancements in Whole Powder Pattern Modelling / Scardi, P. -- On the simulation of the anisotropic peak broadening in powder diffraction / Zlokazov, V. B. -- XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process / Borca, E. / Bercu, M. / Georgescu, S. / Hodorogea, S. / Cotoi, E. -- Cumulants and moments in the line profile analysis / Čerčanský, M. -- X-ray line-broadening analysis of dislocations in a single crystal of Zr / Griffiths, M. -- XRD line profile analysis of calcite powders produced by high energy milling / Pesenti, H. / Leoni, M. / Scardi, P. -- Refining real structure parameters of disordered layer structures within the Rietveld method / Ufer, K. / Kleeberg, R. / Bergmann, J. / Curtius, H. / Dohrmann, R. -- Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation / Wüstefeld, Ch. / Dopita, M. / Klemm, V. / Heger, D. / Rafaja, D. -- MATERIALS MICROSTRUCTURE -- Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films / Bedi, R. K. / Brar, S. S. / Kaur, N. / Kumar, S. / Mahajan, A. -- Structural and optical properties of AgInSe2 films / Bedi, R. K. / Pathak, D. / Deepak / Kaur, D. -- In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor / Filatov, E. / Shubin, Yu. / Sharafutdinov, M. -- Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium / He, D. / Wang, J. Y. / Mittemeijer -- Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments / Kudrenko, E. A. / Shmyt'ko, I. M. / Sinitsyn, V. V. / Ponyatovsky, E. G. / Red'kin, B. N. -- Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods / Shmytko, I. M. / Kudrenko, E. A. / Strukova, G. K. / Kedrov, V. V. / Klassen, N. V. -- Refinement of extinction-affected X-ray reflection profile of textures / Tomov, I. / Vassilev, S. -- STRESSES AND STRAINS -- Diffraction analysis of elastic strains in micro- and nanostructures / Thomas, O. -- Determination of residual stress at weld interruptions by neutron diffraction / Turski, M. / Francis, J. A. / Withers, P. J. -- Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation / Dopita, M. / Wüstefeld, Ch. / Klemm, V. / Schreiber, G. / Heger, D. / Růžička, M. / Rafaja, D. -- In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants / Kuru, Y. / Wohlschlögel, M. / Welzel, U. / Mittemeijer, E. J. -- THIN FILMS -- Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction / Birkholz, M. / Darowski, N. / Zizak, I. -- X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry / Klaus, M. / Genzel, Ch. / Holzschuh, H. -- Magnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition / Kužel, R. / Nichtová, L. / Matěj, Z. / Šícha, J. / Musil, J. -- Influence of reactive plasmas on thin nickel films / Quaas, M. / Ivanova, O. / Helm, C. A. / Wulff, H. -- Author Index
Sommario/riassunto: Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Titolo autorizzato: Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials  Visualizza cluster
ISBN: 3-486-99256-2
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996308768403316
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Serie: Zeitschrift für Kristallographie. . -Supplement issue ; ; Number 27.