1997 IEEE International Reliability Physics Symposium
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| Titolo: |
1997 IEEE International Reliability Physics Symposium
|
| Pubblicazione: | [Place of publication not identified], : IEEE, 1997 |
| Descrizione fisica: | 1 online resource (540 pages) |
| Disciplina: | 621.381 |
| Soggetto topico: | Electronic apparatus and appliances - Reliability |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Sommario/riassunto: | These papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported. |
| Titolo autorizzato: | 1997 IEEE International Reliability Physics Symposium |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910872619403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |