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100   $a20160829d1997      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$a1997 IEEE International Reliability Physics Symposium
210 31$a[Place of publication not identified]$cIEEE$d1997
215   $a1 online resource (540 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780335752 
311 08$a0780335759 
330   $aThese papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported.
606   $aElectronic apparatus and appliances$xReliability$vCongresses
615  0$aElectronic apparatus and appliances$xReliability
676   $a621.381
712 02$aIEEE, Institute of Electrical and Electronics Engineers, Inc. Staff
801  0$bPQKB
906   $aBOOK
912   $a9910872619403321
996   $a1997 IEEE International Reliability Physics Symposium$92512805
997   $aUNINA